Drexel University Home Pagewww.drexel.edu DREXEL UNIVERSITY LIBRARIES HOMEPAGE >>
iDEA DREXEL ARCHIVES >>

iDEA: Drexel E-repository and Archives > Drexel Theses and Dissertations > Drexel Theses and Dissertations > Experimental studies and modeling of an information embedded power system

Please use this identifier to cite or link to this item: http://hdl.handle.net/1860/24

File Description SizeFormat
carullo_thesis.pdf2.49 MBAdobe PDFView/Open
Title: Experimental studies and modeling of an information embedded power system
Authors: Carullo, Stephen P.
Keywords: Electric power systems -- Communication systems
Electric power systems
Stochastic systems
Computer and electrical engineering
Issue Date: 20-Nov-2002
Publisher: Drexel University
Abstract: This thesis is concerned with the design and analysis of the Interconnected Power Systems Laboratory (IPSL), which will allow students to get experience on the realistic operation and control of power systems. Drexel University' Interconnected Power Systems Laboratory (IPSL), provides an interchangeable real-life, three-bus power system network and an Energy Management System interface to the system in order to provide control and data capturing. The designed EMS system utilizes client/server and industry standard computer networking technology in order to expose students to modern data acquisition and supervisory control (SCADA) equipment and procedures used by the power industry. This thesis describes the methodology used to design the flexible power system along with the EMS system and they system's unique features. Three experiments, the Single-Phase AC Power Flow Experiment, the Three-Phase AC Power Flow Experiment, and the Fault Analysis Experiment, have been created for use with the IPSL system and will be discussed in detail.
URI: http://dspace.library.drexel.edu/handle/1860/24
Appears in Collections:Drexel Theses and Dissertations

Items in iDEA are protected by copyright, with all rights reserved, unless otherwise indicated.

 

Valid XHTML 1.0! DSpace Software Copyright © 2002-2007 MIT and Hewlett-Packard - Feedback