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Please use this identifier to cite or link to this item: http://hdl.handle.net/1860/1238

Title: Numerical derivative analysis of load-displacement curves in depth-sensing indentation
Authors: Juliano, Thomas Frank
Domnich, Vladislav
Buchheit, Thomas E.
Gogotsi, Yury G.
Issue Date: 2004
Publisher: Materials Research Society
Citation: Materials Research Society Symposium Proceedings, 791: pp. 191-202. Retrieved September 19, 2006 from http://nano.materials.drexel.edu/Papers/NumericalDerivativeAnal.pdf.
Abstract: We have investigated strain fields around GaN nanoindentations. Stress relaxation around the edges of the nanoindentation was evident in atomic force microscopy images. More detailed information on the strain fields was obtained from Raman scattering, which has been used to analyze the shape of the strain field around the indentation. We find that the Berkovich tip giving a triangular imprint on the sample generates a strain field, which represents a hexagonal pattern. Negative values of the strain indicate that the residual stress is compressive. Strain is larger in the center of the indentation than outside. Analysis of the ratio of the frequency shift of the E2 and A1sLOd modes suggests that the residual strains are close to biaxial state outside the indentation contact zone, and mostly hydrostatic within the indentation center.
URI: http://hdl.handle.net/1860/1238
Appears in Collections:Faculty Research and Publications (MSE)

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